Burn-in Systems

 

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Delta V Instruments offers a complete range of burn-in systems with testing capabilities for both package and wafer level testing. Customized systems can be developed to meet specific customer needs. Our test hardware has the capacity to test a wide range of applications including:

 q      Digital devices
q      Memory devices
q      Microprocessor and Micro-controller devices
q      Automotive devices
q      RF devices

                           

PTC-224    Power & Temperature Cycling System

Delta V Instruments now offer a dual chamber Power & Temperature Cycling System with adaptable racking and easily configurable power rails. Click on the following link to view a 3-Dimensional rack drawing set for this unique system.

Project PTC (save to desktop for optimal viewing)

The Delta V Instruments PL-Series offers a flexible solution to a variety of burn-in needs. Available with 8 burn-in board slots per chamber, each system incorporates state-of-the-art driver technology for maximum drive and monitoring capability. Our modular system architecture allows ease of upgrade as technology and testing techniques change...more info
 


As the industry moves towards KGD and multi-chip modules there is an increasing need for burn-in systems capable of performing the burn-in test function at the wafer level. These wafer level burn-in systems are being designed around several driving factors...more info
 

 

Systems can be custom designed to meet specific customer requirements. Starting with the basic building blocks already available from Delta V it is possible to develop systems for RF, High Power, Mixed Signal or other one-off test system. By using this modular system architecture a custom system can often be produced within tight budget constraints...more info
 

 

 


 

 
   

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