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March 2007
Delta
V and Antares
Advanced Test Technologies, Inc., Vancouver, Washington have reached
and agreement regarding the TSE BOSS burn-in board tester. Delta V
acquired the world wide manufacturing and sales rights to the TSE
tester effective March 1. Delta V will offer new test systems,
provide software and hardware updates for installed systems, and
repair service for installed systems. For more information
contact Jim Crossland - 972.644.6501
July
2004
 Despatch
Industries and Delta V Instruments Partner on Solution for Power and
Temperature Cycling
September 2003
Delta V Instruments has developed a
low cost, entry level burn-in system, specifically designed to meet
the needs of IC qualification. This system is geared towards Fabless
semiconductor companies who rely on test houses to perform their
production burn-in. The stimulus hardware provides up to 128 drive
lines with the option to perform state by state DUT output
monitoring. Each burn-in board can be fed with up to 180A of DC
power with real-time monitoring available for both voltage and
current. Test vectors can be loaded easily into 8M of on-board DRAM
and a variety of timing sets are available. Optional interface cards
allow the system to be configured for Kineticon, Criteria or Aehr
formats.
Click
here
to view
more details on this system. If you would like to discuss your
specific application requirements please contact Mike
Taylor - 972.644.6501
December 2002
Raytheon Systems have requested Delta
V Instruments to provide additional system capacity for the burn-in
of their microwave transceiver modules. The ongoing success of this project clearly
indicates that Delta V Instruments is a leading resource for RF
burn-in hardware and test services.
January 2002
Delta V
Instruments has received an order from Raytheon Systems to design
and manufacture RF based burn-in systems for their microwave
transceiver modules. The RF
driver hardware will be capable of testing at very high frequencies
over a wide range of voltage levels.
In addition to the hardware order, Raytheon have also contracted
with Delta V Instruments to provide a full turnkey solution for
their burn-in test needs.
September 1999
Motorola have
taken delivery of four fully configured dual chamber, 8" Wafer Level
Burn-In Test (WLBT) Systems. Each chamber has been designed to test up to
twenty-eight wafers simultaneously and will be used to perform
production burn-in test on their 32-bit micro-controller with
embedded flash memory product.
The WLBT systems make use of a ‘sacrificial metal’ layer with
passive components for die isolation etched into the scribe lines. A
number of die are grouped into clusters which are then tested
sequentially using BIST routines. Contact with several I/O pins
within each cluster is achieved using pogo pins and parallel
bussing. Motorola designed the sacrificial metal layer and testing
is performed using DFT features with serial output monitoring.
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