The Delta V Instruments PL-Series offers a flexible solution to a variety of burn-in needs. Available with 8 burn-in board slots per chamber, each system incorporates state-of-the-art driver technology for maximum drive and monitoring capability. Our modular system architecture allows ease of upgrade as technology and testing techniques change.

 Chamber Design   

PL-208 Chamber Spec  

The PL-Series system is built around the versatile Despatch RBC chamber.

q      4kW Heaters
q      Room ambient +20°C to +170°C
q      Temperature uniformity ±2.0°C
q      Temperature gradient 6°C at 125°C ambient
q      25°C to 125°C within 10 minutes
q      125°C to 60°C within 40 minutes
q      Power dissipation is 1.4kW at 150°C
q      Horizontal Airflow

I/O Channels
The PL-Series has up to 256 I/O channels and has the capability of driving 256 independent channels as inputs to the Device Under Test (DUT). The large number of channels allows higher test coverage for burn-in of high pin-count devices. Up to 128 channels can be allocated to device output monitoring, important for JTAG and BIST applications such as microprocessor, system-on-chip (SOC) and memory device testing. 

Pattern Depth
The PL-Series can accommodate pattern vectors up to 16M across 128-drive channels. Downloading the patterns at run-time is fast and efficient using an Ethernet link between the Host Controller and the driver hardware.

Pattern Generation and Drive
A distributed architecture allows multiple test patterns to be run simultaneously within the same chamber. The stimulus hardware can support all types of DFT structures and various vector formats can be defined such as NRZ, RTZ, RT1.

Bias Voltages
All supplies can be programmed to perform independent step or set sequences within the overall test program to prevent device latch-up. The large number of supply rails available allows a high degree of flexibility in the way test routines are written. Voltage and current levels can be monitored throughout the burn-in cycle and voltage sensing can be routed from the burn-in board.

Monitoring
Test During Burn-In (TDBI) is a critical step in providing a guaranteed burn-in environment. It ensures the stimulus being fed to the DUT is correct and that the device is being exercised throughout the burn-in cycle. TDBI eliminates failing parts from the testing process and provides essential qualification data. The PL-Series hardware can be configured to have up to 128 monitor channels allowing a high degree of device feedback.

Lot Control and Reporting Format
The PL-Series burn-in systems run under an MS-Windows environment with multiple systems sharing a common data base and test program library. Throughout the burn-in cycle the local controller will monitor all system activity and take action if any pre-defined fault criteria is found. All burn-in taking place is monitored to ensure ‘up-time’ is recorded only when the DUT is receiving the correct inputs (temperature, bias levels and stimulus). At the end of the burn-in cycle a completion report is stored in archive. This report can be in a format specific to the customers needs and will include a copy of the temperature chart for the burn-in cycle.

Other Chamber Formats
Package level burn-in can be provided in two additional chamber formats. The ‘standard’ format can dissipate 7500 watts @ 125°C while the ‘high power’ format can dissipate 15000 watts @ 125°C. Both formats use the same stimulus hardware as the PL-Series but can accommodate up to 48 burn-in boards for production style burn-in requirements.