Current hardware and software technologies have been implemented in active RF testing of medium power Microwave Transceiver modules during burn-in testing. Precision high speed measurement of DC bias and RF output levels during active product testing at high temperature has proven to provide immediate results in product reliability and yield enhancements.

This has been implemented using the current technologies of high-speed PLD devices and mixed signal data acquisition devices driving the device under test in an in-use application manner. Exercising these modules through different modes of transmit, receive, standby, etc. at high speed while monitoring bias levels and outputs has proven to correlate directly with results in actual device applications. This directly couples burn-in testing data analysis with actual field experience along with the enhancement of elevated temperature to sort out device calibration and infant mortally issues.